Study of Structural Phase Transitions by Hard X-ray Photoelectron Diffraction
Aimo Winkelmann (Laser Zentrum Hannover)

Changes of the symmetry of crystalline phases can lead to changes in element-resolved photoelectron diffraction patterns.
In this context, simulations of the expected Kikuchi diffraction patterns allow to estimate the sensitivity of hard X-ray photoelectron diffraction measurement to small changes in a crystal structure.
As examples, the tetragonality of strained SiGe thin films and the sensitivity to domain formation in perovskites will be discussed.
It will be analyzed how the observed effects should depend on the crystal orientation, allowing the optimization of possible experiments.