A new Dynamic-XPS setup at beamline P04 for fast investigation of advanced materials
Sergey Babenkov (Deutsches Elektronen Synchrotron DESY, Hamburg)

Technical progress in construction of X-ray sources, such as Free Electron Laser and Synchrotron Radiation of fourth generation Facilities, as well as in manufacture of electron spectrometers and detectors provides researchers new possibilities to investigate more complex and advanced materials. By recording core-level and valence-band spectra in dynamic mode one can obtain information about processes, which take place on the solid surfaces and subsurfaces of advanced materials during varying of different sample conditions. With an aim to follow such processes in a real-time, a new Dynamic-XPS setup was built up and installed to beamline P04 (PETRA III, DESY, Hamburg). The experimental setup is based on hemispherical electron spectrometer Argus (ScientaOmicron NanoTechnology GmbH) and allows to measure photoemission spectra with energy and time resolution down to 30 meV and 0.1 s/spectrum correspondently. The concept was verified during 2 successful experiments: “real time XPS characterization of thermally induced process of graphene formation on model cubic-SiC(001)/Si(001) wafer” and “metal top-organic interface formation (Indium/CuPcF4) at room temperature conditions”.